Download Instructor Resources of Testing of Digital Systems - Instructor's Solutions Manual
PDF Please note that by purchasing this product, you will only receive instructor resources related to the book. This product does not include the book itself. by N. K. Jha, New Jersey S. Gupta, Sourn
Information
Format: PDF Language: English Publisher: Cambridge University Press Publication Date of the Electronic Edition: 2002
?
ISBN: 9780521773560, 0521773563, 9780511074622, 051107462X, 9781282387133, 9780511077739, 9780511076169
$14.9
$2.98Discount Coupon
Delivery time: Instant
Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. Most comprehensive book yet on digital systems testing Covers all the latest techniques Includes System-on-a-Chip testing
$14.9
$2.98Discount Coupon
Delivery time: Instant